A review of the analysis of surfaces and thin films by AES and XPS-Reference-Cited by-同舟云学术

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A review of the analysis of surfaces and thin films by AES and XPS

Published:1984-03 Issue:3-4 Volume:34 Page:463-478
ISSN:0042-207X
Container-title:Vacuum
language:en
Short-container-title:Vacuum

Author:

Seah M.P.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation

Reference77 articles.

1. Methods of Surface Analysis;Riggs,1975

2. Methods of Surface Analysis;Joshi,1975

3. Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy,1983

4. Quantitative depth profiling in surface analysis: A review

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