Target current density effects on the yield ratios ln+/l+ (n = 2, 3) for multiply charged secondary ions emitted from Si, Ge and Al targets under 3–10 keV inert gas bombardment
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation
Reference14 articles.
1. Anomalous production of Gen+ (n = 2, 3) secondary ions in the case of 3–10 keV Ar+ bombarded Ge
2. Mechanism of production and the current density effects of doubly charged ion emission from Cd+-bombarded Nb and V targets
3. Experimental and theoretical approaches to the ionization process in secondary-ion emission
4. Study of current density effects of secondary ion emission from fcc, bcc and hcp crystal structures
5. Current density effects for Mg + ion sputter-emission from a Mg surface
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Enhanced emission of Ge2+ secondary ions under N2+ bombardment;Vacuum;1996-03
2. A SIMS study of embedded primary atom (Ar+ and Ne+) signals from Si and Ge surfaces under intense ion bombardment;Journal of Nuclear Materials;1995-12
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