Preparation of high quality Al TEM specimens via a double-jet electropolishing technique
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference26 articles.
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2. Sample preparation for transmission electron microscopy of germanium;Riesz;Rev Sci Instr,1961
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4. Techniques for the direct examination of metals by transmission in the electron microscope;Kelley;J Inst Met,1958
5. Microjet method for preparation of wire samples for transmission electron microscopy;Stickler;J Sci Instrum,1963
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