Chapter 3 Carbon Nanotube Electron Sources for Electron Microscopes-Reference-Cited by-同舟云学术

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Chapter 3 Carbon Nanotube Electron Sources for Electron Microscopes

Published:2009 Issue: Volume: Page:203-233
ISSN:1076-5670
Container-title:Advances in Imaging and Electron Physics
language:
Short-container-title:

Author:

de Jonge Niels

Publisher

Elsevier

Reference41 articles.

1. Addition of different contributions to the charged particle probe size;Barth;Optik,1996

2. Growth and sintering of fullerene nanotubes;Colbert;Science,1994

3. Anisotropic electron-beam damage and the collapse of carbon nanotubes;Crespi;Phys. Rev. B,1996

4. Visibility of single atoms;Crewe;Science,1970

5. High brightness electron beam from a multi-walled carbon nanotube;de Jonge;Nature,2002

Cited by 28 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Effect of Crystallinity on the Field Emission Characteristics of Carbon Nanotube Grown on W-Co Bimetallic Catalyst;Nanomaterials;2024-05-07

2. Cold field emission electron source: From higher brightness to ultrafast beam;Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources;2023

3. Preface;Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources;2023

4. References;Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources;2023

5. Plasma produced by carbon nanotube-generated electron beam;Plasma at the Nanoscale;2022

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