Self consistent fitting method for defect analysis by low-frequency noise measurements in reverse biased p-n junctions
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference10 articles.
1. Low-frequency noise spectroscopy
2. Noise as a diagnostic and prediction tool in reliability physics
3. Deep-level impurity analysis for p-n junctions of a bipolar transistor from low-frequency g-r noise measurements
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1. The study of ESD induced defects in smart power ESD protection circuits using low frequency noise measurements;physica status solidi (a);2008-09-22
2. Effects of oxygen related defects on the electrical and thermal behavior of a n+−p junction;Journal of Applied Physics;2004-01-15
3. Generation-recombination noise in highly asymmetrical p–n junctions;Journal of Applied Physics;2002-07
4. Electrical noise as a reliability indicator in electronic devices and components;IEE Proceedings - Circuits, Devices and Systems;2002-02-01
5. 1/f, g–r and burst noise used as a screening threshold for reliability estimation of optoelectronic coupled devices;Microelectronics Reliability;2000-01
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