ESD protection device design using statistical methods

Author:

Shigyo N,Kawashima H,Yasuda S

Publisher

Elsevier BV

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference10 articles.

1. ESD in silicon integrated circuits;Amerasekera,1995

2. Duvvury C. ESD: Design for IC chip quality and reliability. In: Proceedings of ISQED. 2000. p. 251

3. Duvvury C, Rountree R. A synthesis of ESD input protection scheme. In: Proceedings of ESD Symposium. 1994. p. 88

4. Substrate triggering and salicide on ESD performance and protection circuit design in deep submicron CMOS process;Amerasekera;IEDM Tech. Dig.,1995

5. Electrothermal behavior of deep submicron NMOS transistor under high current snapback (ESD/EOS) conditions;Amerasekera;IEDM Tech. Dig.,1994

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