Author:
Voldman Steven H.,Gross Vaughn P.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Biotechnology,Electronic, Optical and Magnetic Materials
Reference21 articles.
1. Design of ion-implanted MOSFETs with very small physical dimensions;Dennard;IEEE J. Solid State Circuits,1974
2. Determination of threshold failure levels of semiconductor diodes and transistors due to pulsed voltages;Wunsch;IEEE Trans. Nucl. Sci.,1968
3. Pulse power failure modes in semiconductor;Tasca;IEEE Trans. Nucl. Sci.,1970
4. Semiconductor junction non-linear failure power thresholds: Wunsch-Bell revisited;Ash,1983
5. Scaling, optimization and design considerations of electrostatic discharge protection circuits in CMOS technology;Voldman,1993
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