Author:
Asinovsky Leo,Schroth Michael,Shen Fei,Sweeney John J.
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference10 articles.
1. L. Asinovsky, S. Fox, E. Karagiannis, M. Schroth, J. Sweeney, in: Solid State Phenomena 51–52, Scitec Publications, Switzerland, 1996, pp. 179–185.
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4. Parameter-Correlation and Computational Considerations in Multiple-Angle Ellipsometry*
5. Optimization of the polycrystalline silicon-on-silicon dioxide characterization using spectroscopic ellipsometry
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