Analysis of frequency- and temperature-dependent interface states in PtSi/p-Si Schottky diodes
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference22 articles.
1. Metal silicides: An integral part of microelectronics
2. Materials Process and Characterization;Nicolet,1983
3. Nucleation of a new phase from the interaction of two adjacent phases: Some silicides
4. Solid state amorphization in metal/Si systems
5. Correlation between Schottky‐barrier height and the heat of formation of transition‐metal silicides
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