Quantitative analysis of light elements in a heavy material by high energy ion recoil (heir) spectrometry-Reference-Cited by-同舟云学术

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Quantitative analysis of light elements in a heavy material by high energy ion recoil (heir) spectrometry

Published:1983-12 Issue:1-3 Volume:218 Page:111-115
ISSN:0167-5087
Container-title:Nuclear Instruments and Methods in Physics Research
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research

Author:

Moreau C.,Knystautas E.J.,Timsit R.S.,Groleau R.

Publisher

Elsevier BV

Subject

General Engineering

Reference11 articles.

1. Photoelectron and Auger spectroscopy;Carlson,1975

2. The use of 6Li and 35Cl ion beams in surface analysis

3. Depth profiling of light elements in materials with high‐energy ion beams

4. Backscattering spectrometry;Chu,1978

5. High energy ion recoil analysis for the determination of light element concentrations at the surface of aluminium;Timsit,1982

Cited by 22 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. High Energy Ion Beam Analysis Techniques;Materials Science and Technology;2006-09-15

2. Elastic forward analysis using ions: A useful tool for H and light elements determination;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2002-08

3. Modification et caractérisation des surfaces par bombardement ionique;Le Journal de Physique IV;1997-12

4. Segregation induced reconstructions of LiAl(110) alloy surface;Surface Science;1997-04

5. Elastic recoil detection (ERD) of light elements in the near-surface region of Zr and its alloys following corrosion;Surface and Coatings Technology;1996-09

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