1. Study of radiation damage on proton-bombarded GaP by PIXE;Crystal Research and Technology;1987-12
2. Depth profiling by particle‐induced x‐ray emission analysis using a parameter‐fitting technique;Journal of Applied Physics;1987-11
3. Analysis by absorption and scattering of radiation;Journal of Radioanalytical and Nuclear Chemistry Articles;1986-02
4. Depth profiling of brass by means of PIXE;X-Ray Spectrometry;1985-04
5. PIXE analysis of thick targets;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1984-04