Ion beam-induced nanostructuring of AIIIBV semiconductor surfaces studied with dynamic force microscopy and Kelvin probe force spectroscopy-Reference-Cited by-同舟云学术

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Ion beam-induced nanostructuring of AIIIBV semiconductor surfaces studied with dynamic force microscopy and Kelvin probe force spectroscopy

Published:2003-03 Issue:1-2 Volume:210 Page:112-116
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Krok F.,Kolodziej J.,Such B.,Piatkowski P.,Szymonski M.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference16 articles.

1. Formation of Ordered Nanoscale Semiconductor Dots by Ion Sputtering

2. Patterning a surface on the nanometric scale by ion sputtering

3. Ion-induced formation of regular nanostructures on amorphous GaSb surfaces

4. Ordered Quantum Dot Formation by Ion Sputtering

5. Sputter-induced cone and filament formation on InP and AFM tip shape determination

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1. Negative ion formation by neutral hydrogen atom grazing scattering from a LiF(100) surface;RSC Advances;2021

2. AES and EELS tools associated to TRIM simulation methods to study nanostructures on III-V semiconductor surfaces;IOP Conference Series: Materials Science and Engineering;2012-02-07

3. Surface Properties of Nanostructures Supported on Semiconductor Substrates;Kelvin Probe Force Microscopy;2011-09-20

4. Study of the chemical and morphological evolution of InSb(001) surface under low energy ion bombardment;Vacuum;2008-11

5. Tip-Induced Calcite Single Crystal Nanowear;MRS Proceedings;2007

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