Properties of GaN and AlGaN Schottky contacts revealed from I–V–T and C–V–T measurements

Author:

Sawada T,Izumi Y,Kimura N,Suzuki K,Imai K,Kim S.-W,Suzuki T

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference15 articles.

1. Characterization of metal/GaN Schottky interfaces based on I–V–T characteristics

2. Electron transport at metal-semiconductor interfaces: General theory

3. T. Sawada, Y. Ito, N. Kimura, K. Imai, K. Suzuki, S. Sakai, in: Proceedings of the International Workshop on Nitride Semiconductors, IPAP Conference Series, vol. 1, 2000, p. 801.

4. A. Hierro, J. Boeckl, S.A. Ringel, M. Hansen, U.K. Mishra, S. DenBaars, J.S. Speck, D.C. Look, in: Proceedings of the International Workshop on Nitride Semiconductors, IPAP Conference Series, vol. 1, 2000, p. 459.

5. Influence of crystal polarity on the properties of Pt/GaN Schottky diodes

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