Optimal simple step stress accelerated life test design for reliability prediction-Reference-Cited by-同舟云学术

Optimal simple step stress accelerated life test design for reliability prediction

Published:2009-05 Issue:5 Volume:139 Page:1799-1808
ISSN:0378-3758
Container-title:Journal of Statistical Planning and Inference
language:en
Short-container-title:Journal of Statistical Planning and Inference

Author:

Fard Nasser,Li Chenhua

Publisher

Elsevier BV

Subject

Applied Mathematics,Statistics, Probability and Uncertainty,Statistics and Probability

Reference11 articles.

1. Optimal simple step-stress plan for Khamis–Higgins model;Alhadeed;IEEE Trans. Reliability,2002

2. Optimum simple step-stress accelerated life tests for Weibull distribution and Type-I censoring;Bai;Naval Res. Logist.,1993

3. Optimum simple step-stress accelerated life tests with censoring;Bai;IEEE Trans. Reliability,1989

4. Elsayed, E.A., Zhang, H., 2004. Design of optimum simple step-stress accelerated life testing plans. In: Proceedings of the Second IIEC-2004, December 19–21, 2004, Riyadh, Kingdom of Saudi Arabia.

5. Optimum M-step design with K stress variables;Khamis;Comm. Statist. Simulation Comput.,1997

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