XPS measurement of lubricant layer thickness on magnetic recording disks-Reference-Cited by-同舟云学术

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XPS measurement of lubricant layer thickness on magnetic recording disks

Published:1996-06 Issue:1 Volume:81 Page:79-85
ISSN:0368-2048
Container-title:Journal of Electron Spectroscopy and Related Phenomena
language:en
Short-container-title:Journal of Electron Spectroscopy and Related Phenomena

Author:

Hoshino Mitsutoshi,Kimachi Yoshihiro

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Radiation,Electronic, Optical and Magnetic Materials

Reference11 articles.

1. IEEE Trans. Magn.;Linder;MAG-18,1982

2. IEEE Trans. Magn.;Au-Yeung;MAG-19,1983

3. IEEE Trans. Magn.;Kimachi;MAG-23,1987

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3. Direct Visualization of Molecularly Thin Lubricant Films Using Low-Coherence Phase-Shifting Interferometry;IEEE Transactions on Magnetics;2007-09

4. Preparation and tribological performance of perfluoropolyether derived coatings;Applied Surface Science;2007-06

5. Thickness determination of molecularly thin lubricant films by angle-dependent X-ray photoelectron spectroscopy;Applied Surface Science;2007-03

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