Asymptotic properties of estimators in a binomial reliability growth model and its continuous-time analog

Author:

Bhattacharyya Gouri K.,Ghosh Jayanta K.

Publisher

Elsevier BV

Subject

Applied Mathematics,Statistics, Probability and Uncertainty,Statistics and Probability

Reference12 articles.

1. Statistical Analysis of Reliability and Life-Testing Models;Bain,1978

2. Inferences on the parameters and current system reliability for a time truncated Weibull process;Bain;Technometrics,1980

3. Properties of continuous analog estimators for a discrete reliability growth model;Bhattacharyya;IEEE Trans. Reliab.,1989

4. Estimation of parameters in a discrete reliability growth model and some non-standard asymptotics;Bhattacharyya,1988

5. Reliability analysis for complex, repairable systems;Crow,1974

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1. Software Test-Run Reliability Modeling with Non-homogeneous Binomial Processes;2018 IEEE 23rd Pacific Rim International Symposium on Dependable Computing (PRDC);2018-12

2. Reliability Growth Modeling;Wiley StatsRef: Statistics Reference Online;2014-09-29

3. Comment;Technometrics;2010-11

4. Reliability Growth Modeling;Encyclopedia of Statistics in Quality and Reliability;2008-03-15

5. Non-standard asymptotics in an inhomogeneous gamma process;Annals of the Institute of Statistical Mathematics;2005-12

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