Measurement of cryoelectronics heating using a local quantum dot thermometer in silicon-Reference-Cited by-同舟云学术

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Measurement of cryoelectronics heating using a local quantum dot thermometer in silicon

Published:2024-09 Issue:3 Volume:3 Page:100097
ISSN:2709-4723
Container-title:Chip
language:en
Short-container-title:Chip

Author:

de Kruijf Mathieu^ORCID,Noah Grayson M.^ORCID,Gomez-Saiz Alberto^ORCID,Morton John J.L.,Gonzalez-Zalba M. Fernando^ORCID

Funder

UKRI

Publisher

Elsevier BV

Reference45 articles.

1. Scaling silicon-based quantum computing using CMOS technology;Gonzalez-Zalba;Nat. Electron.,2021

2. Quantum logic with spin qubits crossing the surface code threshold;Xue;Nature,2022

3. Fast universal quantum gate above the fault-tolerance threshold in silicon;Noiri;Nature,2022

4. Two-qubit silicon quantum processor with operation fidelity exceeding 99%;Mills;Sci. Adv.,2022

5. Quantum error correction with silicon spin qubits;Takeda;Nature,2022

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Fast Thermodynamic Study on a Silicon Nanotransistor at Cryogenic Temperatures;Nano Letters;2024-07-09

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