HREM contrast simulations for compound semiconductors — a discussion of appropriate imaging parameters
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
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Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Transmissions-Elektronenmikroskopie (TEM);Analytiker-Taschenbuch;1996
2. HREM structure characterization of interfaces in semiconducting multi-layers using molecular-dynamics-supported image interpretation;Journal of Microscopy;1995-08
3. Holographic measurement of the wave aberration of an electron microscope by means of the phases in the Fourier spectrum;Journal of Microscopy;1995-08
4. Crystallographic HREM studies of small CdTe crystallites;Ultramicroscopy;1993-02
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