Force measurement with a piezoelectric cantilever in a scanning force microscope
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference12 articles.
1. Atomic Force Microscope
2. Atomic force microscope–force mapping and profiling on a sub 100‐Å scale
3. Force microscope using a fiber‐optic displacement sensor
4. Novel optical approach to atomic force microscopy
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4. A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans;Beilstein Journal of Nanotechnology;2015-02-13
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