The preparation of transmission electron microscope specimens from compound semiconductors by ion milling
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference28 articles.
1. The preparation of thin films of germanium and silicon
2. Method of preparing Si and Ge specimens for examination by transmission electron microscopy
3. Examen direct des métaux par transmission en microscopie et diffraction électroniques
4. Sample Preparation for Transmission Electron Microscopy of Germanium
5. Composition Dependence of Equal Thickness Fringes in an Electron Microscope Image of GaAs/AlxGa1-xAs Multilayer Structure
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