Ultimate resolution and information in electron microscopy II. The information limit of transmission electron microscopes
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference14 articles.
1. Ultimate resolution and information in electron microscopy: general principles
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4. Phase retrieval through focus variation for ultra-resolution in field-emission transmission electron microscopy
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