Artefacts in non-contact mode force microscopy: the role of adsorbed moisture
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference13 articles.
1. Atomic Force Microscope
2. Reconstruction of STM and AFM images distorted by finite-size tips
3. Direct imaging of the tip shape by AFM
4. Tip artefacts in scanning force microscopy
5. Tip's finite size effects on atomic force microscopy in the contact mode: simple geometrical considerations for rapid estimation of apex radius and tip angle based on the study of polystyrene latex balls
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2. Recognizing and Avoiding Artifacts in Atomic Force Microscopy Imaging;Methods in Molecular Biology;2011
3. Lateral heterogeneities in supported bilayers from pure and mixed phosphatidylethanolamine demonstrating hydrogen bonding capacity;Biointerphases;2008-12
4. Atomic Force Microscopy;Medical Devices and Systems;2006-04-19
5. Atomic Layer Deposition of Lu Silicate Films Using [(Me[sub 3]Si)[sub 2]N][sub 3]Lu;Journal of The Electrochemical Society;2006
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