Influence of two-dimensional melting on multiple- beam interferometry reflection during the oxidation of aluminium thin films-Reference-Cited by-同舟云学术

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Influence of two-dimensional melting on multiple- beam interferometry reflection during the oxidation of aluminium thin films

Published:1985-09 Issue:3-4 Volume:131 Page:313-319
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Lugomer S.,Stipančić M.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference17 articles.

1. High Temperature Oxidation of Metals;Kofstad,1963

2. Adsorption of oxygen on clean single crystal faces of aluminium

3. Oxygen Chemisorption of a Small Aluminum Cluster

4. Monolayer adsorption of oxygen on aluminium

5. Crystallization and Thermal Treatment of Thin Films;Točickij,1976

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Reorganization of Langmuir–Blodgett layers of silica nanoparticles induced by the low energy, high fluence ion irradiation;Thin Solid Films;2012-03

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