A case study for XPD in the presence of a compositional depth profile: interface formation between metals (Ag, Al) and HgCdTe
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
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1. X-ray photoelectron diffraction from (3×3) and (√3×√3)R 30° (0001)Si 6H–SiC surfaces;Journal of Applied Physics;1998-12
2. Plasma cleaning and nitridation of sapphire substrates for AlxGa1−xN epitaxy as studied by x-ray photoelectron diffraction;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1998-07
3. Growth of Sn thin films on CdTe(111);Surface Science;1997-04
4. Plasma Cleaning and Nitridation of Sapphire Substrates for AlxGa1-xN Epitaxy as Studied by ARXPS and XPD;MRS Proceedings;1997
5. Surfaces/interfaces of narrow-gap II-VI compounds;Narrow-gap II–VI Compounds for Optoelectronic and Electromagnetic Applications;1997
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