New method for empirically determining surface electronic species from multiple-bias STM images: a multivariate classification approach
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
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2. Scanning Tunneling Microscopy Identification of Atomic-Scale Intermixing on Si(100) at Submonolayer Ge Coverages;Physical Review Letters;2000-05-15
3. Electronic Structure of Semiconductor Surfaces;Electronic Structure;2000
4. Electronic structure classifications using scanning tunneling microscopy conductance imaging;Journal of Applied Physics;1998-09
5. Multi-imaging and multivariate statistics used for 3D characterization at surfaces;Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences;1996-11-15
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