Nanometer scale imaging of cobalt silicide in air using atomic force microscope and scanning tunneling microscope
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference12 articles.
1. Scanning tunneling microscopy
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5. Hydrogen terminated Si(100) surfaces studied by scanning tunneling microscopy, x‐ray photon spectroscopy, and Auger electron spectroscopy
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2. Growth of vertically-aligned carbon nanotube forests on conductive cobalt disilicide support;Journal of Applied Physics;2010-07-15
3. The influence of Ti and TiN on the thermal stability of CoSi2.;MRS Proceedings;2001
4. Growth and Surface Morphology of Thin Silicon Films Using an atomic Force Microscope;MRS Proceedings;1992
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