A simplified Kerkhof-Moulijn model for dispersion quantification from XPS atomic concentrations
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference7 articles.
1. Quantitative analysis of XPS intensities for supported catalysts
2. Bimodal particle size distribution and surface segregation of zeolite-supported catalysts from XPS data
3. The characterization of heterogeneous catalysts by XPS based on geometrical probability 1: Monometallic catalysts
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