A new approach to measure ion reflection and secondary ion emission during ion bombardment of atomically clean and smooth monocrystalline metal surfaces
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference7 articles.
1. SECONDARY ION EMISSION
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3. 8th Intern. Conf. on Phenomena in Ionization of Gases;Yurasova,1967
4. Generation of clean surfaces in high vacuum
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1. Strategy: Fitting the Technique to the Problem;Studies in Analytical Chemistry;1988
2. Plasma Cleaning of Surfaces;Surface Contamination;1979
3. A combined fim, aes and LEED study of the structure and composition of ion bombarded tungsten surfaces;Surface Science;1975-06
4. LOW-ENERGY ION SCATTERING SPECTROMETRY;Methods of Surface Analysis;1975
5. Ion scattering for analysis of surfaces and surface layers;Journal of Vacuum Science and Technology;1974-01
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