A method for preparing atom probe specimens for nanoscale compositional analysis of metallic thin films-Reference-Cited by-同舟云学术

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A method for preparing atom probe specimens for nanoscale compositional analysis of metallic thin films

Published:1993-04 Issue:1-4 Volume:67 Page:407-412
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Hasegawa N.,Hono K.,Okano R.,Fujimori H.,Sakurai T.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference10 articles.

1. Direct evidence for compositional fluctuation in sputtered Co-Cr thin films

2. Atom probe field ion microscopy of a FeNiB glass

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