Estimation of the lowest limit of 1/f noise in semiconductor materials-Reference-Cited by-同舟云学术

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Estimation of the lowest limit of 1/f noise in semiconductor materials

Published:2020-02 Issue:6 Volume:384 Page:126145
ISSN:0375-9601
Container-title:Physics Letters A
language:en
Short-container-title:Physics Letters A

Author:

Grüneis Ferdinand^ORCID

Publisher

Elsevier BV

Subject

General Physics and Astronomy

Reference26 articles.

1. The relation between 1/f noise and the number of electrons;Hooge;Physica B,1990

2. 1/f noise in semiconductor materials;Hooge,1995

3. Experimental studies on 1/f noise;Hooge;Rep. Proc. Phys.,1981

4. l/f noise sources;Hooge;IEEE Trans. Electron Devices,1994

5. Microcycle spectral estimates of l/f noise;Caloyannides;J. Appl. Phys.,1978

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. 1/f noise from the sequence of nonoverlapping rectangular pulses;Physical Review E;2023-03-13

2. 1/f noise under drift and thermal agitation in semiconductor materials;Physica A: Statistical Mechanics and its Applications;2022-05

3. The transition from generation–recombination noise in bulk semiconductors to discrete switching in small-area semiconductors;Physica A: Statistical Mechanics and its Applications;2021-04

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