Subject
Artificial Intelligence,Computer Networks and Communications,Hardware and Architecture,Software
Reference43 articles.
1. Z. Wang, K. Chakrabarty, Test data compression for IP embedded cores using selective encoding of scan slices, in: Proceedings of International Test Conference (ITC’2005), 2005, pp. 581–590. http://dx.doi.org/10.1109/TEST.2005.1584019.
2. ITRS, International Technology Roadmap for Semiconductors, 2011.
3. B. Koenemann, C. Barnhart, B. Keller, T. Snethen, O. Farnsworth, D. Wheater, A smartbist variant with guaranteed encoding, in: Proceedings of Asian Test Symposium (ATE’2001), 2001, pp. 325–330. http://dx.doi.org/10.1109/ATS.2001.990304.
4. Embedded deterministic test;Rajski;IEEE Trans. Comput.-Aided Des. Integr. Circu. Syst.,2004
5. X-compact: an efficient response compaction technique;Mitra;IEEE Trans. Comput.-Aided Des. Integr. Circ. Syst.,2004
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Decompressors using nonlinear codes;Microprocessors and Microsystems;2020-07