1. M. Köntges, S. Altmann, T. Heimberg, U. Jahn, K.A. Berger, Mean degradation rates in PV systems for various kinds of PV module failures, in: Proceedings of the 32nd European Photovoltaic Solar Energy Conference and Exhibition, Munich, Germany, 2016, pp. 1435–1443.
2. C. Kohn, T. Faber, R. Kübler, J. Beinert, G. Kleer, F. Clement, D. Erath, I. Reis, F. Martin, A. Müller, Analyses of warpage effects induced by passivation and electrode coatings in silicon solar cells, in: Proceedings of the 22nd European Photovolatic Solar Energy Conference and Exhibition, Milan, Italy, 2007, pp. 1270–1273.
3. S. Dietrich, M. Pander, M. Sander, M. Ebert, Mechanical investigations on metallization layouts of solar cells with respect to module reliability, in: Proceedings of the 3rd International Conference on Crystalline Silicon Photovoltaics (SiliconPV 2013), 38(0), 203, pp. 488–497. 〈https://doi.org/10.1016/j.egypro.2013.07.308〉.
4. C. Kohn, R. Kübler, M. Krappitz, G. Kleer, I. Reis, M. Retzlaff, D. Erath, D. Biro, Influence of the metallization process on the strength of silicon solar cells, 21, 2009. 〈https://doi.org/10.4229/24thEUPVSEC2009-2CV.2.4〉.
5. Y. Zemen, T. Prewitz, T. Geipel, S. Pingel, J. Berghold, The impact of yield strength of the interconnector on the internal stress of the solar cell within a module, in: Proceedings of the 25th European Photovoltaic Solar Energy Conference and Exhibition/ 5th World Conference on Energy Conversion, Valencia, Spain, 2010, pp. 4073–4078.