Efficiency limiting crystal defects in monocrystalline silicon and their characterization in production-Reference-Cited by-同舟云学术

Efficiency limiting crystal defects in monocrystalline silicon and their characterization in production

Published:2018-11 Issue: Volume:186 Page:217-226
ISSN:0927-0248
Container-title:Solar Energy Materials and Solar Cells
language:en
Short-container-title:Solar Energy Materials and Solar Cells

Author:

Korsós Ferenc,Roszol László,Jay Frederic,Veirman Jordi,Draoua Abdelkarim Derbouz,Albaric Mickael,Szarvas Tamás,Kiss Zoltán,Szabó Attila,Soczó István,Nádudvari György,Laurent Nicolas

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Reference24 articles.

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3. Defects in Monocrystalline Silicon, Springer Handbook of Electronic and Photonic Materials;Ammon,2017

4. On the properties of the intrinsic points defects in silicon: a perspective from crystal growth and wafer processing;Falster;Phys. Status Solidi (b),2000

5. Grown-in microdefects, residual vacancies and oxygen precipitation bands in Czochralski silicon;Voronkov;J. Cryst. Growth,1999

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