Calculation of band offsets at the CdS/SnS heterojunction
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials
Reference16 articles.
1. Influence of temperature and pressure on the electronic transitions in SnS and SnSe semiconductors;Parenteau;Phys. Rev. B,1990
2. Optical spectra and energy band structure of layer-type AIVBVI compounds;Valiukonis;Phys. Stat. Sol. (b),1986
3. Electrodeposition and characterization of SnS thin films;Mishra;J. Electrochem. Soc.,1989
4. Simplified chemical deposition technique for good quality SnS thin films;Nair;Semicond. Sci. Technol.,1991
5. Characterization of vacuum-evaporated tin sulfide film for solar cell materials;Noguchi;Sol. Energy Mater. Sol. Cells,1994
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