Applications of spectroscopic ellipsometry for multilayer analysis of CdTe solar cell structures incorporating Magnesium–Zinc oxide high resistivity transparent layers-Reference-Cited by-同舟云学术

Applications of spectroscopic ellipsometry for multilayer analysis of CdTe solar cell structures incorporating Magnesium–Zinc oxide high resistivity transparent layers

Published:2023-10 Issue: Volume:261 Page:112523
ISSN:0927-0248
Container-title:Solar Energy Materials and Solar Cells
language:en
Short-container-title:Solar Energy Materials and Solar Cells

Author:

Razooqi Alaani Mohammed A.^ORCID,Koirala Prakash,Ramanujam Balaji,Shan Ambalanath,Phillips Adam B.,Heben Michael J.,O'Leary Stephen K.,Podraza Nikolas J.,Collins Robert W.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

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