NIST VUV metrology programs to support space-based research-Reference-Cited by-同舟云学术

NIST VUV metrology programs to support space-based research

Published:2006-01 Issue:2 Volume:37 Page:283-296
ISSN:0273-1177
Container-title:Advances in Space Research
language:en
Short-container-title:Advances in Space Research

Author:

Vest Robert E.,Barad Yaniv,Furst Mitchell L.,Grantham Steve,Tarrio Charles,Shaw Ping-Shine

Publisher

Elsevier BV

Subject

Space and Planetary Science,Aerospace Engineering,General Earth and Planetary Sciences,Atmospheric Science,Geophysics,Astronomy and Astrophysics

Reference30 articles.

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5. Electron beam-induced increase of electron diffusion length in p-type GaN and AlGaN/GaN superlattices;Chernyak;Appl. Phys. Lett.,2000

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