High-resolution pursuit for detecting flaw echoes close to the material surface in ultrasonic NDT-Reference-Cited by-同舟云学术

High-resolution pursuit for detecting flaw echoes close to the material surface in ultrasonic NDT

Published:2006-09 Issue:6 Volume:39 Page:487-492
ISSN:0963-8695
Container-title:NDT & E International
language:en
Short-container-title:NDT & E International

Author:

Ruiz-Reyes N.,Vera-Candeas P.,Curpián-Alonso J.,Cuevas-Martínez J.C.,Blanco-Claraco J.L.

Publisher

Elsevier BV

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science

Reference10 articles.

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2. Ultrasonic flaw detection using split spectrum processing combined with adaptive-network-based fuzzy inference systems;Sun;Proc IEEE Ultrason Sympos,1999

3. Chen S, Donoho D. Basis pursuit. Proceedings of the 28th Asilomar conference on signals, systems and computers, vol. 1. 1994. p. 1–44.

4. Basis pursuit. Technical report;Chen,1995

5. Application of adaptive time-frequency decomposition in ultrasonic NDE of highly scattering materials;Zhang;Ultrasonics,2000

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