Author:
Matyi R.J.,Depero L.E.,Bontempi E.,Colombi P.,Gibaud A.,Jergel M.,Krumrey M.,Lafford T.A.,Lamperti A.,Meduna M.,Van der Lee A.,Wiemer C.
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference9 articles.
1. Handbook of Silicon Semiconductor Metrology;Hayzelden,2001
2. X-ray and Neutron Reflectivity: Principles and Applications;Gibaud,1999
3. A simple solution to systematic errors in density determination by X-ray reflectivity: The XRR-density evaluation (XRR-DE) method
4. Versailles Project on Advanced Materials and Standards (www.vamas.org).
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