Gravitational waves detector mirrors: Spectroscopic ellipsometry study of Ta2O5 films on SiO2 substrates-Reference-Cited by-同舟云学术

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Gravitational waves detector mirrors: Spectroscopic ellipsometry study of Ta2O5 films on SiO2 substrates

Published:2011-02 Issue:9 Volume:519 Page:2877-2880
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Prato Mirko,Chincarini Andrea,Gemme Gianluca,Canepa Maurizio

Funder

Istituto Nazionale di Fisica Nucleare

European Commission

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference26 articles.

1. Ground-based interferometers and their science reach

2. Excess mechanical loss associated with dielectric mirror coatings on test masses in interferometric gravitational wave detectors

3. Thermal noise in interferometric gravitational wave detectors due to dielectric optical coatings

4. Irreversibility and Generalized Noise

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