Subject
Hardware and Architecture,Software
Reference41 articles.
1. Soft error susceptibilities of 22 nm Tri-gate devices;Seifert;IEEE Trans. Nucl. Sci.,2012
2. R. Baumann, The impact of technology scaling on soft error rate performance and limits to the efficacy of error correction, in: IEDM, 2002.
3. A survey of techniques for improving error-resilience of DRAM;Mittal;J. Syst. Archit.,2018
4. Reliability concerns in embedded system designs;Narayanan;Computer,2006
5. Voltage scaling and aging effects on soft error rate in SRAM-based FPGAs;Kastensmidt;Elsevier Microelectron. Reliab.,2014
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献