Author:
Le Q.T.,Gül Arslan E.,Rip J.,De Coster H.,Verdonck P.,Radisic D.,Schleicher F.,Vaesen I.,Conard T.,Altamirano-Sanchez E.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference33 articles.
1. Size-dependent resistivity in nanoscale interconnects;Josell;Annu. Rev. Mater. Res.,2009
2. Specular electron scattering at single-crystal Cu(001) surfaces
3. Deposition Technologies of Materials for CuInterconnects. Copper Interconnect Technology;Gupta,2009
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