Processing high-purity silicon used for sensor applications

Author:

Ten Kate W.R.Th.,Audet S.A.

Publisher

Elsevier BV

Subject

General Engineering

Reference17 articles.

1. Strip detector — CCD coupling by means of a bipolar transistor;ten Kate;Nucl. Instrum. Methods,1984

2. The production and availability of high resistivity silicon for detector application;von Ammon;Nucl. Instrum. Methods,1984

3. Survey of literature on minority carrier lifetimes in silicon and related topics;Ross,1980

4. Fabrication of low noise silicon radiation detectors by the planar process;Kemmer;Nucl. Instrum. Methods,1980

5. The effect of thermal and radiation defects on the recombination properties of the base region of diffused silicon p-n structures;Kuchinskii;Solid State Electron,1986

Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Rapid thermal process-induced defects in silicon position detectors;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1994-01

2. The influence of preamorphization on the properties of shallow p+ n-junctions in silicon radiation detectors;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1993-03

3. Processing high-quality silicon for microstrip detectors;Sensors and Actuators A: Physical;1992-04

4. Compatibility between bipolar readout electronics and microstructures in silicon;Sensors and Actuators A: Physical;1992-03

5. Optimization of the energy resolution of the diffusion based nuclear radiation sensors;Microelectronic Engineering;1991-10

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