A DFT study on the electron affinity of tetrachloro-p-benzoquinone: Toward to understanding its electron-accepting ability in solution
Author:
Publisher
Elsevier BV
Subject
Physical and Theoretical Chemistry,Condensed Matter Physics,Biochemistry
Reference54 articles.
1. Detoxifying carcinogenic polyhalogenated quinones by hydroxamic acids via an unusual double Lossen rearrangement mechanism;Zhu;Proc. Natl. Acad. Sci. USA,2010
2. Role of quinones in toxicology;Bolton;Chem. Res. Toxicol.,2000
3. Time-resolved photoelectron imaging of the chloranil radical anion: ultrafast relaxation of electronically excited electron acceptor states;Horke;Phys. Chem. Chem. Phys.,2011
4. Potential mechanism for pentachlorophenol-induced carcinogenicity: a novel mechanism for metal-independent production of hydroxyl radicals;Zhu;Chem. Res. Toxicol.,2009
5. Catalytic degradation of chlorinated phenols;Meunier;Science,2002
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