Segmentation of unsorted cloud of points data from full field optical measurement for metrological validation-Reference-Cited by-同舟云学术

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Segmentation of unsorted cloud of points data from full field optical measurement for metrological validation

Published:2012-01 Issue:1 Volume:63 Page:30-44
ISSN:0166-3615
Container-title:Computers in Industry
language:en
Short-container-title:Computers in Industry

Author:

Sitnik Robert,Błaszczyk Paweł M.

Publisher

Elsevier BV

Subject

General Engineering,General Computer Science

Reference16 articles.

1. MAPS: multiresolution adaptive parameterization of surfaces;Lee,1998

2. International Vocabulary of Basic and General Terms in Metrology;BIPM, IEC, IFCC, ISO, IUPAC, IUPAP, OIML,1993

3. Guide to the Expression of Uncertainty in Measurement;BIPM, IEC, IFCC, ISO, IUPAC, IUPAP, OIML,1993

4. Expression of the Uncertainty of Measurement in Calibration;EA-4/02,1999

5. Is contact measurement out of touch?;David;Quality Digest Magazine,2003

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