Surface degradation of InP during contact formation—An FTIR analysis-Reference-Cited by-同舟云学术

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Surface degradation of InP during contact formation—An FTIR analysis

Published:1995-04 Issue:3 Volume:36 Page:655-659
ISSN:1350-4495
Container-title:Infrared Physics & Technology
language:en
Short-container-title:Infrared Physics & Technology

Author:

Henry J.,Livingstone J.

Publisher

Elsevier BV

Subject

Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference8 articles.

1. Indium phosphide surface processing — an FTIR analysis

2. Infrared Spectra of Adsorbed Species;Little,1966

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Unveiling the mechanism of ultraviolet-induced degradation in silicon heterojunction solar cells;Solar Energy Materials and Solar Cells;2024-10

2. Modeling of sputtered and electron-beam evaporated multilayer ITO/InP solar cells based on efficiency studies;SPIE Proceedings;2001-10-29

3. Further aspects of damage-induced junction mechanisms and the role of phosphorus movement in double-layer in-chamber annealed In-Sn/ITO/InP solar cells;Journal of Physics: Condensed Matter;1998-04-06

4. Effects of oxidized layers on built-in potentials in ITO/InP solar cells;International Journal of Electronics;1997-09

5. Improved double layer ITO/InP solar cells using annealing techniques;Physica Status Solidi (a);1996-07-16

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