Fault-tolerant deep learning inference on CPU-GPU integrated edge devices with TEEs

Author:

Xu Hongjian,Liao LonglongORCID,Liu XinqiORCID,Chen Shuguang,Chen Jianguo,Liang Zhixuan,Yu Yuanlong

Publisher

Elsevier BV

Reference41 articles.

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4. S. Hong, P. Frigo, Y. Kaya, C. Giuffrida, T. Dumitraş, Terminal brain damage: Exposing the graceless degradation in deep neural networks under hardware fault attacks, in: 28th USENIX Security Symposium, USENIX Security 19, pp. 497–514, URL: https://dl.acm.org/doi/10.5555/3361338.3361373.

5. Security monitoring of IEC 61850 substations using IEC 62351-7 network and system management;Albarakati;IEEE Trans. Ind. Inform.,2022

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