Triple junction controlled grain growth in thin films

Author:

Zöllner D.

Publisher

Elsevier BV

Subject

Computational Mathematics,General Physics and Astronomy,Mechanics of Materials,General Materials Science,General Chemistry,General Computer Science

Reference67 articles.

1. X-ray diffraction contrast tomography: a novel technique for three-dimensional grain mapping of polycrystals. I. Direct beam case;Ludwig;J. Appl. Cryst.,2008

2. New opportunities for 3D materials science of polycrystalline materials at the micrometre lengthscale by combined use of X-ray diffraction and X-ray imaging;Ludwig;Mater. Sci. Eng. A,2009

3. New 3DXRD results on recrystallization and grain growth;Juul Jensen;Mater. Sci. Forum,2012

4. Metal Microstructures in 2D, 3D and 4D, Proceedings of the 40th Risø International Symposium on Materials Science, Editors: A. Godfrey, N. Hansen, C. Hong, X. Huang, D. Juul Jensen, W. Pantleon, T. Wang, T. Yu, Y. Zhang, X. Zhang, Technical University of Denmark 2019.

5. Grain growth in four dimensions: a comparison between simulation and experiment;McKenna;Acta Mater.,2014

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