Simulation of defect formation, amorphization and cluster formation processes in nc-TiN/a-Si3N4 nanocomposite under Xe irradiation-Reference-Cited by-同舟云学术

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Simulation of defect formation, amorphization and cluster formation processes in nc-TiN/a-Si3N4 nanocomposite under Xe irradiation

Published:2018-02 Issue: Volume:143 Page:143-156
ISSN:0927-0256
Container-title:Computational Materials Science
language:en
Short-container-title:Computational Materials Science

Author:

Uglov V.V.,Safronov I.V.,Remnev G.E.,Saladukhin I.A.,Kvasov N.T.,Dorozhkin N.N.,Shymanski V.I.

Funder

Russian Science Foundation

Publisher

Elsevier BV

Subject

Computational Mathematics,General Physics and Astronomy,Mechanics of Materials,General Materials Science,General Chemistry,General Computer Science

Reference73 articles.

1. Structural properties, internal stress and thermal stability of nc-TiN/a-Si3N4, nc-TiN/TiSix and nc-(Ti1−yAlySix)N superhard nanocomposite coatings reaching the hardness of diamond

2. The role of percolation threshold for the control of the hardness and thermal stability of super- and ultrahard nanocomposites

3. Different approaches to superhard coatings and nanocomposites

4. Thermal stability of nanostructured superhard coatings: A review

5. Chemistry, physics and fracture mechanics in search for superhard materials, and the origin of superhardness in nc-TiN/a-Si3N4 and related nanocomposites

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Atomic scale formation mechanism of the Amorphous-Nanocrystalline biphase structure in TiSiN Coating: Phase field crystal simulation and experimental characterization;Applied Surface Science;2024-05

2. EPR study of silicon nitride (Si3N4) nanoparticles exposed to neutron irradiation;Radiation Physics and Chemistry;2022-06

3. Study of the Effect of Low-Energy Irradiation with O2+ Ions on Radiation Hardening and Modification of the Properties of Thin TiO2 Films;Journal of Inorganic and Organometallic Polymers and Materials;2020-10-16

4. Radiation resistance of thin TiN films as a result of irradiation with low-energy Kr14+ ions;Ceramics International;2020-04

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