Atomic Force Microscope in Forensic Examination

Abstract

Criminal activities have their footprints from time immemorial and nature of crime has drastically changed over a period of time. There is neither a geographical boundary, nor technical limitations. Moreover terrorist’s activities, drug trafficking eco-crimes, high-profile crimes, robbery hit and run cases, building collapse, petroleum products adulteration are some of latest forms of crimes. In last 20 years, scanning probe microscopes have emerged as an essential technique in various fields, and atomic force microscope (AFM) is most commonly used scanning probe technique which has shown its wide range of application in examination of various evidences encountered on crime scene. Major advantages of AFM involve its high resolution in three dimensions, and sample is not necessary to be conductive and it does not need to be operated within a vacuum. It helps in studying a large range of topographies and many types of materials can be imaged under it. Evidences such as blood, fibers, hair, soil, finger prints, gunshot residue, pollen, etc. found on crime scene at nano- or micro-level can be examined under AFM. The chapter describes applications of AFM with respect to its application in examination of evidences that can help in bringing justice.