The Properties of Ferroelectric Films at Small Dimensions

Author:

Shaw T. M.1,Trolier-McKinstry S.2,McIntyre P. C.3

Affiliation:

1. IBM Research, T. J. Watson Research Center. Yorktown Heights, New York 10598;

2. Materials Research Laboratory, Pennsylvania State University, University Park, Pennsylvania 16802;

3. Department of Materials Science and Engineering, Stanford University, Stanford, California 94305;

Abstract

▪ Abstract  This paper reviews the literature on size effects in ferroelectric materials, with an emphasis on thin film perovskite ferroelectrics. The roles of boundary conditions, defect chemistry, electrode interfaces, surface layers, and microstructure in controlling the measured properties of ferroelectric films, as well as the observed deviation from bulk properties are discussed. Examples of the manifestation of size effects in terms of the low and high field dielectric properties, the piezoelectric effect, and the leakage behavior of films are given.

Publisher

Annual Reviews

Subject

General Materials Science

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